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A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.

Joao AzevedoArnaud VirazelAlberto BosioLuigi DililloPatrick GirardAida Todri-SanialJérémy Alvarez-HeraultKen Mackay
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
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  • wireless sensor networks
  • quantitative analysis
  • automatic analysis