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Analyzing resistive-open defects in SRAM core-cell under the effect of process variability.

Elena I. VatajeluAlberto BosioLuigi DililloPatrick GirardAida TodriArnaud VirazelNabil Badereddine
Published in: ETS (2013)
Keyphrases
  • process model
  • databases
  • data mining
  • image analysis
  • business processes
  • development process