Nabil Badereddine

Publication Activity (10 Years)

Years Active: 2005-2014
Publications (10 Years): 0

Top Topics

Wireless Transmission

Mutual Exclusion

Write Operations

Low Power Consumption

Top Venues

J. Electron. Test.

Publications

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Nabil Badereddine
On the Test and Mitigation of Malfunctions in Low-Power SRAMs. J. Electron. Test. 30 (5) (2014)
Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. Asian Test Symposium (2013)
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. DTIS (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Test solution for data retention faults in low-power SRAMs. DATE (2013)
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. ETS (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
A built-in scheme for testing and repairing voltage regulators of low-power srams. VTS (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Defect analysis in power mode control logic of low-power SRAMs. ETS (2012)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. J. Electron. Test. 28 (3) (2012)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Low-power SRAMs power mode control logic: Failure analysis and test solutions. ITC (2012)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine
Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium (2011)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
On using address scrambling to implement defect tolerance in SRAMs. ITC (2011)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS (2011)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
A statistical simulation method for reliability analysis of SRAM core-cells. DAC (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Setting test conditions for improving SRAM reliability. ETS (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Detecting NBTI induced failures in SRAM core-cells. VTS (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. ETS (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA (2010)
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electron. Test. 24 (4) (2008)
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Serge Pravossoudovitch, Christian Landrault
Power-Aware Test Data Compression for Embedded IP Cores. ATS (2006)
Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich
Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. VLSI-SoC (2006)
Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault
Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. VLSI-SoC (2005)
Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault
Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS (2005)