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On the Test and Mitigation of Malfunctions in Low-Power SRAMs.
Leonardo Bonet Zordan
Alberto Bosio
Luigi Dilillo
Patrick Girard
Arnaud Virazel
Nabil Badereddine
Published in:
J. Electron. Test. (2014)
Keyphrases
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low power
power consumption
high speed
low cost
high power
single chip
vlsi architecture
wireless transmission
digital signal processing
logic circuits
gate array
vlsi circuits
real time
cmos technology
power dissipation
hardware and software
embedded systems
wireless networks
image processing