Leonardo Bonet Zordan

Publication Activity (10 Years)

Years Active: 2011-2016
Publications (10 Years): 4

Top Topics

Delay Insensitive

Low Power Consumption

Top Venues

Publications

Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo Bonet Zordan
An effective BIST architecture for power-gating mechanisms in low-power SRAMs. ISQED (2016)
Khalid Latif, Manuel Selva, Charles Effiong, Roman Ursu, Abdoulaye Gamatié, Gilles Sassatelli, Leonardo Bonet Zordan, Luciano Ost, Piotr Dziurzanski, Leandro Soares Indrusiak
Design space exploration for complex automotive applications: an engine control system case study. RAPIDO@HiPEAC (2016)
Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger
Improving SRAM test quality by leveraging self-timed circuits. DATE (2016)
Josef Kinseher, Moritz Völker, Leonardo Bonet Zordan, Ilia Polian
Failure mechanisms and test methods for the SRAM TVC write-assist technique. ETS (2016)
Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian
On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs. ATS (2015)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Nabil Badereddine
On the Test and Mitigation of Malfunctions in Low-Power SRAMs. J. Electron. Test. 30 (5) (2014)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Test solution for data retention faults in low-power SRAMs. DATE (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
A built-in scheme for testing and repairing voltage regulators of low-power srams. VTS (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Defect analysis in power mode control logic of low-power SRAMs. ETS (2012)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Low-power SRAMs power mode control logic: Failure analysis and test solutions. ITC (2012)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine
Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium (2011)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS (2011)