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Failure Analysis and Test Solutions for Low-Power SRAMs.

Leonardo Bonet ZordanAlberto BosioLuigi DililloPatrick GirardSerge PravossoudovitchAida TodriArnaud VirazelNabil Badereddine
Published in: Asian Test Symposium (2011)
Keyphrases
  • low power
  • power consumption
  • low cost
  • high speed
  • high power