Login / Signup
Test solution for data retention faults in low-power SRAMs.
Leonardo Bonet Zordan
Alberto Bosio
Luigi Dilillo
Patrick Girard
Aida Todri
Arnaud Virazel
Nabil Badereddine
Published in:
DATE (2013)
Keyphrases
</>
low power
high speed
power consumption
low cost
single chip
vlsi circuits
signal processing
computer systems
fault diagnosis