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Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles.

Nabil BadereddinePatrick GirardSerge PravossoudovitchArnaud VirazelChristian Landrault
Published in: VLSI-SoC (2005)
Keyphrases
  • power reduction
  • power consumption
  • low power
  • real time
  • power saving