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Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing.
Elena I. Vatajelu
Luigi Dilillo
Alberto Bosio
Patrick Girard
Aida Todri
Arnaud Virazel
Nabil Badereddine
Published in:
Asian Test Symposium (2013)
Keyphrases
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test suite
item response theory
database
neural network
genetic algorithm
test cases
low power
software testing
white box testing
image processing
website
case study
software systems
improved algorithm
open systems
code coverage