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A statistical simulation method for reliability analysis of SRAM core-cells.

Renan Alves FonsecaLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchArnaud VirazelNabil Badereddine
Published in: DAC (2010)
Keyphrases
  • reliability analysis
  • mathematical model
  • statistical information
  • machine learning
  • statistical methods
  • neural network
  • real world
  • feature selection
  • classification accuracy
  • optimization algorithm
  • fault tree