Renan Alves Fonseca

Publication Activity (10 Years)

Years Active: 2010-2012
Publications (10 Years): 0

Top Topics

Rapid Development

Data Processing

Local Area Network

Top Venues

J. Electron. Test.

Publications

Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. J. Electron. Test. 28 (3) (2012)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
On using address scrambling to implement defect tolerance in SRAMs. ITC (2011)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
A statistical simulation method for reliability analysis of SRAM core-cells. DAC (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Setting test conditions for improving SRAM reliability. ETS (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Detecting NBTI induced failures in SRAM core-cells. VTS (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. ETS (2010)
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA (2010)