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Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes.

Renan Alves FonsecaLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchArnaud VirazelNabil Badereddine
Published in: J. Electron. Test. (2012)
Keyphrases
  • cost effective
  • case study
  • power consumption
  • rapid development
  • local area network
  • data processing
  • computer systems