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Impact of Resistive-Bridging Defects in SRAM Core-Cell.
Renan Alves Fonseca
Luigi Dilillo
Alberto Bosio
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Nabil Badereddine
Published in:
DELTA (2010)
Keyphrases
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databases
power consumption
factors that influence
defect detection
data sets
case study
rough sets