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Impact of Resistive-Bridging Defects in SRAM Core-Cell.

Renan Alves FonsecaLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchArnaud VirazelNabil Badereddine
Published in: DELTA (2010)
Keyphrases
  • databases
  • power consumption
  • factors that influence
  • defect detection
  • data sets
  • case study
  • rough sets