Zhanglei Wang

Publication Activity (10 Years)

Years Active: 2005-2012
Publications (10 Years): 0

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty
Diagnostic system based on support-vector machines for board-level functional diagnosis. ETS (2012)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Physical-Defect Modeling and Optimization for Fault-Insertion Test. IEEE Trans. Very Large Scale Integr. Syst. 20 (4) (2012)
Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. ITC (2011)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Board-level fault diagnosis using Bayesian inference. VTS (2010)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. Asian Test Symposium (2010)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Board-level fault diagnosis using an error-flow dictionary. ITC (2010)
Seongmoon Wang, Wenlong Wei, Zhanglei Wang
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. IEEE Trans. Very Large Scale Integr. Syst. 18 (12) (2010)
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (8) (2009)
Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek
Deviation-Based LFSR Reseeding for Test-Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (2) (2009)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Physical defect modeling for fault insertion in system reliability test. ITC (2009)
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electron. Test. 24 (4) (2008)
Zhanglei Wang, Krishnendu Chakrabarty
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (2) (2008)
Zhanglei Wang, Krishnendu Chakrabarty
Test Data Compression Using Selective Encoding of Scan Slices. IEEE Trans. Very Large Scale Integr. Syst. 16 (11) (2008)
Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. ETS (2007)
Lei Li, Zhanglei Wang, Krishnendu Chakrabarty
Scan-BIST based on cluster analysis and the encoding of repeating sequences. ACM Trans. Design Autom. Electr. Syst. 12 (1) (2007)
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE (2007)
Zhanglei Wang, Krishnendu Chakrabarty
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. J. Electron. Test. 23 (2-3) (2007)
Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar
A low cost test data compression technique for high n-detection fault coverage. ITC (2007)
Zhanglei Wang, Krishnendu Chakrabarty
An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time. ATS (2006)
Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel
Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE (2006)
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Serge Pravossoudovitch, Christian Landrault
Power-Aware Test Data Compression for Embedded IP Cores. ATS (2006)
Zhanglei Wang, Krishnendu Chakrabarty
Built-in self-test of molecular electronics-based nanofabrics. ETS (2005)
Zhanglei Wang, Krishnendu Chakrabarty
Test data compression for IP embedded cores using selective encoding of scan slices. ITC (2005)
Zhanglei Wang, Krishnendu Chakrabarty
Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. ITC (2005)