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An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time.

Zhanglei WangKrishnendu Chakrabarty
Published in: ATS (2006)
Keyphrases
  • test data
  • test cases
  • test set
  • data sets
  • training data
  • training set
  • similarity measure
  • machine learning
  • decision trees
  • training samples
  • data mining
  • learning algorithm
  • pairwise
  • prior knowledge
  • object oriented