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A low cost test data compression technique for high n-detection fault coverage.

Seongmoon WangZhanglei WangWenlong WeiSrimat T. Chakradhar
Published in: ITC (2007)
Keyphrases
  • test data
  • low cost
  • training data
  • test cases
  • training set
  • test set
  • data sets
  • image compression
  • training and test data
  • real time
  • compression ratio
  • search based testing
  • support vector
  • relational databases
  • data model