Seongmoon Wang

Publication Activity (10 Years)

Years Active: 1994-2011
Publications (10 Years): 0

Publications

Seongmoon Wang
An efficient method to screen resistive opens under presence of process variation. VTS (2011)
Xiangyu Tang, Seongmoon Wang
A Low Hardware Overhead Self-Diagnosis Technique Using Reed-Solomon Codes for Self-Repairing Chips. IEEE Trans. Computers 59 (10) (2010)
Seongmoon Wang, Wenlong Wei, Zhanglei Wang
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. IEEE Trans. Very Large Scale Integr. Syst. 18 (12) (2010)
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (8) (2009)
Xiangyu Tang, Seongmoon Wang
A self-diagnosis technique using Reed-Solomon codes for self-repairing chips. DSN (2009)
Seongmoon Wang, Wenlong Wei
Machine learning-based volume diagnosis. DATE (2009)
Seongmoon Wang, Wenlong Wei
Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. ETS (2008)
Seongmoon Wang, Wenlong Wei
Cost Efficient Methods to Improve Performance of Broadcast Scan. ATS (2008)
Seongmoon Wang, Wenlong Wei
An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (11) (2008)
Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. IEEE Trans. Computers 57 (7) (2008)
Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell
Zero Cost Test Point Insertion Technique for Structured ASICs. VLSI Design (2007)
Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar
A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding. ATS (2007)
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei
A hybrid scheme for compacting test responses with unknown values. ICCAD (2007)
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE (2007)
Seongmoon Wang, Wenlong Wei
A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture. ASP-DAC (2007)
Seongmoon Wang
A BIST TPG for Low Power Dissipation and High Fault Coverage. IEEE Trans. Very Large Scale Integr. Syst. 15 (7) (2007)
Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar
Unknown blocking scheme for low control data volume and high observability. DATE (2007)
Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar
A low cost test data compression technique for high n-detection fault coverage. ITC (2007)
Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng
Coverage loss by using space compactors in presence of unknown values. DATE (2006)
Seongmoon Wang, Srimat T. Chakradhar
A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (8) (2006)
Seongmoon Wang, Sandeep K. Gupta
LT-RTPG: a new test-per-scan BIST TPG for low switching activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (8) (2006)
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei
Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. DAC (2006)
Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell
Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. ATS (2006)
Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar
Efficient unknown blocking using LFSR reseeding. DATE (2006)
Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar
PIDISC: Pattern Independent Design Independent Seed Compression Technique. VLSI Design (2006)
Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar
XWRC: externally-loaded weighted random pattern testing for input test data compression. ITC (2005)
Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
Response shaper: a novel technique to enhance unknown tolerance for output response compaction. ICCAD (2005)
Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. ICCD (2005)
Wei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy
Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. VLSI Design (2005)
Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar
Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. DATE (2004)
Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan
Re-configurable embedded core test protocol. ASP-DAC (2004)
Seongmoon Wang, Srimat T. Chakradhar
A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. ITC (2003)
Seongmoon Wang, Sandeep K. Gupta
An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (8) (2002)
Seongmoon Wang, Sandeep K. Gupta
DS-LFSR: a BIST TPG for low switching activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (7) (2002)
Seongmoon Wang
Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. ITC (2002)
Seongmoon Wang, Sandeep K. Gupta
LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. ITC (1999)
Seongmoon Wang, Sandeep K. Gupta
ATPG for Heat Dissipation Minimization During Test Application. IEEE Trans. Computers 47 (2) (1998)
Seongmoon Wang, Sandeep K. Gupta
ATPG for Heat Dissipation Minimization During Scan Testing. DAC (1997)
Seongmoon Wang, Sandeep K. Gupta
DS-LFSR: A New BIST TPG for Low Heat Dissipation. ITC (1997)
Seongmoon Wang, Sandeep K. Gupta
ATPG for Heat Dissipation Minimization During Test Application. ITC (1994)