LT-RTPG: a new test-per-scan BIST TPG for low switching activity.

Seongmoon Wang Sandeep K. Gupta

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)

Keyphrases

built in self test
high levels
daily activities
activity patterns
information systems
three dimensional
multi agent
expert systems
hidden markov models
test cases
statistical tests
false positive and false negative