FALSE POSITIVE AND FALSE NEGATIVE
Experts
- Nicola Laurenti
- Toshihiko Namekawa
- Masao Kasahara
- Zhen Chen
- Peter Schlicht
- Karthik Sridharan
- Irene MartÃnez
- Robin Chan
- Mojtaba Rahmati
- Fabian Hüger
- Hideki Yagi
- Andreas Lenz
- Nathan Srebro
- Sven Puchinger
- Francesco Renna
- Shigeichi Hirasawa
- Tolga M. Duman
- Lorenz Welter
- Ambuj Tewari
- Dimitrios Koukopoulos
- Dong Xiang
- Yasuo Sugiyama
- H. Vincent Poor
- Hanno Gottschalk
- Kira Maag
- Stefano Tomasin
- Matthias Rottmann
- Chiranjib Bhattacharyya
- Khalid A. Qaraqe
- J. Janney
- David Dagon
- Daniel Kern
- Wei Zeng
- Cliff C. Zou
- Gentiane Haesbroeck
- Yvan Pointurier
- David Sodoyer
- Yiqiu Mao
- Michelle T. LeFree
Venues
- CoRR
- IEEE Trans. Inf. Theory
- ITC
- Sensors
- Commun. Stat. Simul. Comput.
- FUSION
- J. Am. Medical Informatics Assoc.
- RAID
- ISIT
- VTS
- Bioinform.
- IEEE Commun. Lett.
- ISI
- J. Comput. Phys.
- IEEE Access
- WOCC
- ASCC
- ISCAS
- HIS (2)
- Inf. Process. Lett.
- KONVENS
- ICSEA
- FSKD
- ISWCS
- ISITA
- Expert Syst. Appl.
- WKDD
- IEEE Trans. Very Large Scale Integr. Syst.
- J. Electron. Test.
- Math. Oper. Res.
- SMC (5)
- ICCAD
- ACC
- Adv. Eng. Softw.
- ISPEC
- Comput. Networks
- J. Comput. Geom.
- ICRA
- VITAE
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend