Boxue Yin

Publication Activity (10 Years)

Years Active: 2009-2022
Publications (10 Years): 3

Top Topics

Symbolic Execution

Acid Properties

Read Only Transactions

Top Venues

Proc. VLDB Endow.

IEEE Trans. Very Large Scale Integr. Syst.

Trustcom/BigDataSE/ISPA

Publications

Zhenkun Yang, Chuanhui Yang, Fusheng Han, Mingqiang Zhuang, Bing Yang, Zhifeng Yang, Xiaojun Cheng, Yuzhong Zhao, Wenhui Shi, Huafeng Xi, Huang Yu, Bin Liu, Yi Pan, Boxue Yin, Junquan Chen, Quanqing Xu
OceanBase: A 707 Million tpmC Distributed Relational Database System. Proc. VLDB Endow. 15 (12) (2022)
Jingwei Ma, Boxue Yin, Zhi Kong, Yuxiang Ma, Chang Chen, Long Wang, Gang Wang, Xiaoguang Liu
Leveraging Page-Level Compression in MySQL - A Practice at Baidu. Trustcom/BigDataSE/ISPA (2016)
Jie Shao, Boxue Yin, Bujiao Chen, Guangshu Wang, Lin Yang, Jianliang Yan, Jianying Wang, Weidong Liu
Read Consistency in Distributed Database Based on DMVCC. HiPC (2016)
Dong Xiang, Wenjie Sui, Boxue Yin, Kwang-Ting Cheng
Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing. IEEE Trans. Very Large Scale Integr. Syst. 22 (9) (2014)
Zhen Chen, J. Feng, Dong Xiang, Boxue Yin
Scan chain configuration based X-filling for low power and high quality testing. IET Comput. Digit. Tech. 4 (1) (2010)
Zhen Chen, Dong Xiang, Boxue Yin
The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost. VTS (2009)
Dong Xiang, Boxue Yin, Krishnendu Chakrabarty
Compact Test Generation for Small-Delay Defects Using Testable-Path Information. Asian Test Symposium (2009)
Dong Xiang, Boxue Yin, Kwang-Ting Cheng
Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. VTS (2009)
Boxue Yin, Dong Xiang, Zhen Chen
New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets. VLSI Design (2009)
Zhen Chen, Dong Xiang, Boxue Yin
A power-effective scan architecture using scan flip-flops clustering and post-generation filling. ACM Great Lakes Symposium on VLSI (2009)
Zhen Chen, Boxue Yin, Dong Xiang
Conflict driven scan chain configuration for high transition fault coverage and low test power. ASP-DAC (2009)