Scan chain configuration based X-filling for low power and high quality testing.
Zhen ChenJ. FengDong XiangBoxue YinPublished in: IET Comput. Digit. Tech. (2010)
Keyphrases
- low power
- high quality
- power consumption
- low cost
- high speed
- high power
- single chip
- digital signal processing
- logic circuits
- vlsi circuits
- wireless transmission
- vlsi architecture
- image sensor
- energy dissipation
- low power consumption
- mixed signal
- delay insensitive
- image quality
- signal processor
- real time
- gate array
- hardware and software
- digital camera
- routing protocol
- wireless networks
- image processing