Conflict driven scan chain configuration for high transition fault coverage and low test power.

Zhen Chen Boxue Yin Dong Xiang

Published in: ASP-DAC (2009)

Keyphrases

high levels
test cases
significantly lower
wide range
power consumption
high rate
high sensitivity
data sets
data driven
small size
neural network
artificial intelligence
training data
high efficiency
high correlation
low memory requirements