The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost.
Zhen ChenDong XiangBoxue YinPublished in: VTS (2009)
Keyphrases
- high cost
- significantly lower
- high levels
- high correlation
- false positive and false negative
- high sensitivity
- small size
- conflict resolution
- data driven
- learning scheme
- storage space
- maintenance cost
- high rate
- multiresolution
- wide range
- high noise
- highly correlated
- classification scheme
- software testing
- high precision
- detection scheme
- replacement policy
- pruning power
- neural network