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Experts
- Kenichi Okada
- Xin Xu
- Nor Ashidi Mat Isa
- David J. Allstot
- Carmine Ciofi
- Andrea Mazzanti
- Shahriar Mirabbasi
- Igor Djurovic
- Junyan Ren
- Sang-Gug Lee
- François-Xavier Standaert
- Zhangming Zhu
- Thierry Taris
- Jee-Youl Ryu
- Wouter A. Serdijn
- Takeshi Umeki
- Edgar Sánchez-Sinencio
- Yehia Massoud
- Li Geng
- Graziella Scandurra
- Amir Amirabadi
- Akira Matsuzawa
- Koji Enbutsu
- Venkatesan Guruswami
- John R. Long
- Xiaolong Zhang
- Kang-Yoon Lee
- Bertan Bakkaloglu
- Osamu Tadanaga
- Abolfazl Zokaei
- Madhu S. Nair
- Bruce C. Kim
- Tamer Ragheb
- Erik Axell
- Shubin Liu
- Gary K. Fedder
- Vimal Bhatia
- Erwin H. T. Shad
- Etienne E. Kerre
Venues
- ISCAS
- IEEE J. Solid State Circuits
- CoRR
- IEEE Access
- ICECS
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Circuits Syst. II Express Briefs
- Microelectron. J.
- ESSCIRC
- Sensors
- CICC
- IEICE Electron. Express
- IEEE Trans. Instrum. Meas.
- IEICE Trans. Electron.
- MWSCAS
- ASICON
- APCCAS
- J. Circuits Syst. Comput.
- ICASSP
- OFC
- ISSCC
- IEEE Trans. Commun.
- Signal Process.
- IEEE Trans. Ind. Electron.
- NEWCAS
- Int. J. Circuit Theory Appl.
- ISOCC
- Signal Image Video Process.
- SoCC
- BioCAS
- Circuits Syst. Signal Process.
- IEEE Trans. Image Process.
- Microelectron. Reliab.
- Multim. Tools Appl.
- Integr.
- ISCAS (4)
- IEEE Trans. Very Large Scale Integr. Syst.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Signal Process. Lett.
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