Charles F. Hawkins

Publication Activity (10 Years)

Years Active: 1985-2013
Publications (10 Years): 0

Top Topics

Reliability Analysis

Decision Makers

Top Venues

Publications

Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Des. Test 30 (6) (2013)
Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT (2003)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De
. IEEE Trans. Very Large Scale Integr. Syst. 11 (5) (2003)
Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
CMOS IC nanometer technology failure mechanisms. CICC (2003)
Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC (2003)
Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC (2002)
Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC (2002)
Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19 (5) (2002)
Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS (2001)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. 8 (6) (2000)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC (2000)
Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. 16 (4) (1999)
Charles F. Hawkins, Jaume Segura
Test and Reliability: Partners in IC Manufacturing, Part 1. IEEE Des. Test Comput. 16 (3) (1999)
Charles F. Hawkins, Jerry M. Soden
Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. 16 (4) (1999)
Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De
Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED (1999)
Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
CMOS IC reliability indicators and burn-in economics. ITC (1998)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC (1997)
Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
) Analysis for Detecting IC Defects. ITC (1997)
Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. J. Electron. Test. 8 (3) (1996)
Jerry M. Soden, Charles F. Hawkins
IDDQ Testing: Issues Present and Future. IEEE Des. Test Comput. 13 (4) (1996)
Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins
A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. ITC (1995)
Charles F. Hawkins, Jerry M. Soden
IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. 12 (2) (1995)
Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
Defect Classes - An Overdue Paradigm for CMOS IC. ITC (1994)
Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins
Measurement Circuit. ITC (1993)
Richard H. Williams, Charles F. Hawkins
The Economics of Guardband Placement. ITC (1993)
Jerry M. Soden, Charles F. Hawkins
Quality Testing Requires Quality Thinking. ITC (1993)
Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins
Testing Errors: Data and Calculations in an IC Manufacturing Process. ITC (1992)
Charles F. Hawkins
System Testing: The Future for All of Us. ITC (1992)
Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
IDDQ testing: A review. J. Electron. Test. 3 (4) (1992)
Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins
Economic Impact of Type I Test Errors at System and Board Levels. ITC (1992)
Ravi K. Gulati, Charles F. Hawkins
Introduction. J. Electron. Test. 3 (4) (1992)
Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC (1991)
Charles F. Hawkins, Richard H. Williams
EE Curriculum - Continuous Process Improvement? ITC (1991)
Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins
test sets. ITC (1990)
Richard H. Williams, Charles F. Hawkins
Errors in testing. ITC (1990)
Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins
. ITC (1990)
Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC (1989)
Jerry M. Soden, Charles F. Hawkins
Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test 3 (4) (1986)
Jerry M. Soden, Charles F. Hawkins
Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC (1986)
Jerry M. Soden, Charles F. Hawkins
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC (1985)