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) Analysis for Detecting IC Defects.
Edward I. Cole Jr.
Jerry M. Soden
Paiboon Tangyunyong
Patrick L. Candelaria
Richard W. Beegle
Daniel L. Barton
Christopher L. Henderson
Charles F. Hawkins
Published in:
ITC (1997)
Keyphrases
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data sets
trade off
image processing
data analysis
automatic analysis
computer vision
image sequences
feature extraction
multiscale
feature selection
three dimensional
high level
statistical analysis
microarray