Edward I. Cole Jr.

Publication Activity (10 Years)

Years Active: 1997-2008
Publications (10 Years): 0

Publications

Edward I. Cole Jr.
Non-destructive IC defect localization using optical beam-based imaging. CICC (2008)
Edward I. Cole Jr.
Global Failure Localization: We Have To, But on What and How? ITC (2004)
Edward I. Cole Jr.
Global fault localization using induced voltage alteration. Microelectron. Reliab. 41 (8) (2001)
Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
) Analysis for Detecting IC Defects. ITC (1997)