Non-destructive IC defect localization using optical beam-based imaging.
Edward I. Cole Jr.Published in: CICC (2008)
Keyphrases
- optical imaging
- liquid crystal
- phased array
- accurate localization
- synthetic aperture
- electron beam
- optical properties
- integrated circuit
- electro optic
- synthetic aperture imaging
- atmospheric turbulence
- image capture
- light intensity
- digital holography
- image processing
- ccd camera
- high resolution
- imaging modalities
- defect detection
- image analysis
- medical imaging
- imaging systems
- computer vision
- imaging devices
- imaging technology
- localization algorithm
- image sensor
- cross section
- clinical applications
- image acquisition
- reinforced concrete
- acquired images
- x ray