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Experts
- Yeong Min Jang
- Mohanasankar Sivaprakasam
- P. M. Nabeel
- Jayaraj Joseph
- Gordon Wetzstein
- Meng He
- Zabih Ghassemlooy
- Yueping Cai
- Mostafa Zaman Chowdhury
- Markus Axer
- Md. Tanvir Hossan
- Zhenbo Deng
- Denghui Xu
- M. Salman Asif
- J. Ian Munro
- Eiji Oki
- Stanislav Zvanovec
- Moh. Khalid Hasan
- Angelo Nagari
- Mithun Kuniyil Ajith Singh
- Tetsuya Miki
- Paul E. Debevec
- Srinivasa G. Narasimhan
- Naoto Kishi
- Steve Hranilovic
- Yang Liu
- Amirul Islam
- Yusuke Kozawa
- Zhichao Tan
- Bailang Yu
- Longguang Li
- Naoya Koizumi
- Bryce Sandlund
- Jussi Parkkinen
- Yi Zhao
- Katrin Amunts
- Kuo-Cheng Huang
- Wenyi Zhang
- Andrea Baschirotto
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- Displays
- EMBC
- OFC
- IEEE J. Solid State Circuits
- Color Imaging Conference
- ISCAS
- IGARSS
- Microelectron. J.
- IEICE Trans. Electron.
- Microelectron. Reliab.
- I2MTC
- Remote. Sens.
- IEEE Trans. Medical Imaging
- ISSCC
- ISBI
- IEEE Trans. Ind. Electron.
- Proc. IEEE
- ICTON
- IEICE Electron. Express
- ECOC
- CIC
- IEEE Trans. Biomed. Eng.
- IAS
- ESSCIRC
- IEEE SENSORS
- ICECS
- ICRA
- ACM Trans. Graph.
- GLOBECOM
- NEMS
- ICIP
- IEEE Trans. Circuits Syst. II Express Briefs
- Comput. Vis. Image Underst.
- BioCAS
- J. Vis.
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