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Experts
- Yeong Min Jang
- Mohanasankar Sivaprakasam
- Jayaraj Joseph
- P. M. Nabeel
- Gordon Wetzstein
- Meng He
- Md. Tanvir Hossan
- Zhenbo Deng
- Zabih Ghassemlooy
- Markus Axer
- Mostafa Zaman Chowdhury
- Yueping Cai
- M. Salman Asif
- Stanislav Zvanovec
- Eiji Oki
- J. Ian Munro
- Denghui Xu
- Yusuke Kozawa
- Nam Tuan Le
- Steve Hranilovic
- Mithun Kuniyil Ajith Singh
- Naoya Koizumi
- Tetsuya Miki
- Bryce Sandlund
- Longguang Li
- Shiyong Liu
- Ramesh Raskar
- Srinivasa G. Narasimhan
- Yang Liu
- Wenyi Zhang
- Yi Zhao
- Paul E. Debevec
- Moh. Khalid Hasan
- Kuo-Cheng Huang
- Jussi Parkkinen
- Naoto Kishi
- Zhichao Tan
- Chi-Wai Chow
- Angelo Nagari
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- Displays
- EMBC
- OFC
- IEEE J. Solid State Circuits
- Color Imaging Conference
- ISCAS
- IGARSS
- Microelectron. J.
- IEICE Trans. Electron.
- Microelectron. Reliab.
- I2MTC
- IEEE Trans. Medical Imaging
- Remote. Sens.
- ISBI
- ISSCC
- CIC
- ECOC
- Proc. IEEE
- ICTON
- IEICE Electron. Express
- IEEE Trans. Biomed. Eng.
- IEEE Trans. Ind. Electron.
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- ICRA
- ACM Trans. Graph.
- NEMS
- ICIP
- IEEE Trans. Circuits Syst. II Express Briefs
- CICC
- MeMeA
- BioCAS
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