LIGHT INTENSITY
Experts
- Yeong Min Jang
- Jayaraj Joseph
- P. M. Nabeel
- Mohanasankar Sivaprakasam
- Gordon Wetzstein
- Meng He
- Zhenbo Deng
- Md. Tanvir Hossan
- Mostafa Zaman Chowdhury
- Markus Axer
- Yueping Cai
- Zabih Ghassemlooy
- Stanislav Zvanovec
- Eiji Oki
- M. Salman Asif
- J. Ian Munro
- Denghui Xu
- Hoa Le Minh
- Shiyong Liu
- Yanbing Yang
- Oliver Bimber
- Jingying Hou
- Nam Tuan Le
- Ramesh Raskar
- Shree K. Nayar
- Hao Chen
- Alexander Plopski
- Chien-Hung Yeh
- Chris Van Hoof
- Wolfgang Heidrich
- Yu-Hsuan Lin
- Motoharu Matsuura
- Chi-Wai Chow
- Bailang Yu
- Yusuke Kozawa
- Zhichao Tan
- Naoya Koizumi
- Bryce Sandlund
- Longguang Li
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- Displays
- EMBC
- OFC
- IEEE J. Solid State Circuits
- Color Imaging Conference
- ISCAS
- IGARSS
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- IEEE Trans. Medical Imaging
- Remote. Sens.
- I2MTC
- ISBI
- ISSCC
- IEEE Trans. Biomed. Eng.
- CIC
- ECOC
- Proc. IEEE
- IEICE Electron. Express
- ICTON
- IEEE Trans. Ind. Electron.
- ICECS
- IEEE SENSORS
- ESSCIRC
- IAS
- GLOBECOM
- ACM Trans. Graph.
- ICRA
- ICIP
- IEEE Trans. Circuits Syst. II Express Briefs
- NEMS
- IEEE Commun. Lett.
- CICC
- CVPR
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