LIGHT INTENSITY
Experts
- Yeong Min Jang
- P. M. Nabeel
- Jayaraj Joseph
- Mohanasankar Sivaprakasam
- Gordon Wetzstein
- Meng He
- Yueping Cai
- Markus Axer
- Mostafa Zaman Chowdhury
- Zhenbo Deng
- Zabih Ghassemlooy
- Md. Tanvir Hossan
- M. Salman Asif
- Stanislav Zvanovec
- Denghui Xu
- J. Ian Munro
- Eiji Oki
- Angelo Nagari
- Kuo-Cheng Huang
- Yu-Hsuan Lin
- Motoharu Matsuura
- Bryce Sandlund
- Tetsuya Miki
- Hoa Le Minh
- Ramesh Raskar
- Wolfgang Heidrich
- Katrin Amunts
- Oliver Bimber
- Shiyong Liu
- Andrea Baschirotto
- Alexander Plopski
- Yanbing Yang
- Mithun Kuniyil Ajith Singh
- Naoya Koizumi
- Moh. Khalid Hasan
- Hao Chen
- Shree K. Nayar
- Paul E. Debevec
- Nam Tuan Le
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- Displays
- EMBC
- IEEE J. Solid State Circuits
- Color Imaging Conference
- OFC
- IGARSS
- Microelectron. J.
- IEICE Trans. Electron.
- ISCAS
- Microelectron. Reliab.
- IEEE Trans. Medical Imaging
- Remote. Sens.
- ISBI
- IEEE Trans. Biomed. Eng.
- I2MTC
- ICTON
- Proc. IEEE
- ISSCC
- IEICE Electron. Express
- ECOC
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- IAS
- ESSCIRC
- IEEE Trans. Ind. Electron.
- ICECS
- IEEE SENSORS
- ACM Trans. Graph.
- GLOBECOM
- ICRA
- ICIP
- NEMS
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Commun. Lett.
- MeMeA
- CVPR
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