ELECTRON BEAM
Experts
- David Z. Pan
- Bei Yu
- Georges G. E. Gielen
- Yao-Wen Chang
- Charles Chien
- Zhiwei Xu
- Fumihito Arai
- Krishnendu Chakrabarty
- Shao-Yun Fang
- Eby G. Friedman
- Siddharth Garg
- Toshio Fukuda
- Ramesh Karri
- Ge Wang
- Andreas K. Maier
- Jhih-Rong Gao
- Nassir Navab
- Kun Yuan
- Farinaz Koushanfar
- S. J. Ben Yoo
- Hafizur Rahaman
- Kenneth L. Shepard
- Lihong Zhang
- Etienne Sicard
- Ulf Schlichtmann
- Alexandre Boyer
- John E. Bowers
- A. M. J. Koonen
- Stephen R. Duncan
- Zizheng Cao
- Mark M. Tehranipoor
- Makoto Ikeda
- Csaba Andras Moritz
- Kunihiro Asada
- Ioannis Savidis
- Martin D. F. Wong
- Youngsoo Shin
- Sandip Kundu
- Masahiro Nakajima
Venues
- CoRR
- Sensors
- Microelectron. Reliab.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- NEMS
- OFC
- Microelectron. J.
- IEEE Access
- IEEE J. Solid State Circuits
- Proc. IEEE
- DAC
- IBM J. Res. Dev.
- CICC
- IEICE Trans. Electron.
- ICTON
- IEEE Trans. Instrum. Meas.
- ISCAS
- ITC
- Symmetry
- J. Comput. Chem.
- ICCAD
- IEEE Trans. Medical Imaging
- IEEE Trans. Very Large Scale Integr. Syst.
- VLSI Design
- IEICE Electron. Express
- Comput. Phys. Commun.
- EMBC
- DATE
- IEEE SENSORS
- ICECS
- ISBI
- IEEE Commun. Mag.
- ISQED
- ECOC
- Int. J. Autom. Technol.
- ESSDERC
- 3DIC
- IET Circuits Devices Syst.
- MIXDES
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