Alexandre Boyer

Publication Activity (10 Years)

Years Active: 2003-2021
Publications (10 Years): 6

Top Topics

Defect Detection

Reliability Analysis

Electromagnetic Field

Top Venues

Microelectron. Reliab.

Publications

Alexandre Boyer, Rami Abiemona, Miodrag Bolic, Emil M. Petriu
Vessel Identification using Convolutional Neural Network-based Hardware Accelerators. CIVEMSA (2021)
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70 (2021)
Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
Detecting PCB Assembly Defects Using Infrared Thermal Signatures. MIXDES (2019)
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
New defect detection approach using near electromagnetic field probing of high density PCBAs. Microelectron. Reliab. (2018)
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. J. Electron. Test. 34 (6) (2018)
Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW (2018)
He Huang, Alexandre Boyer, Sonia Ben Dhia
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectron. Reliab. 55 (9-10) (2015)
Alexandre Boyer, M. Cavarroc
Enhancement of the spatial resolution of near-field immunity maps. EMC Compo (2015)
V. Tomasevic, Alexandre Boyer, Sonia Ben Dhia
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs. EMC Compo (2015)
Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. EMC Compo (2015)
Etienne Sicard, Alexandre Boyer, Priscila Fernandez-Lopez, An Zhou, Nicolas Marier, Frédéric Lafon
EMC performance analysis of a processor/memory system using PCB and Package-On-Package. EMC Compo (2015)
He Huang, Alexandre Boyer, Sonia Bendhia
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. Microelectron. Reliab. 55 (9-10) (2015)
Alexandre Boyer, Sonia Ben Dhia
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. J. Low Power Electron. 10 (1) (2014)
Laurent Chusseau, Rachid Omarouayache, Jeremy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise Ribotta
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC (2014)
Sonia Ben Dhia, Alexandre Boyer
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. LATW (2014)
Sonia Ben Dhia, Alexandre Boyer
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. Microelectron. Reliab. 53 (9-11) (2013)
Sonia Ben Dhia, Alexandre Boyer
Electro-magnetic robustness of integrated circuits: from statement to prediction. EMC Compo (2013)
Alexandre Boyer, Sonia Ben Dhia
Effect of aging on power integrity of digital integrated circuits. LATW (2013)
Alexandre Boyer, Sonia Ben Dhia
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. EMC Compo (2013)
C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. EMC Compo (2013)
Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing. Microelectron. Reliab. 53 (9-11) (2013)
Alexandre Boyer, Sonia Ben Dhia, B. Li, C. Lemoine, Bertrand Vrignon
Prediction of Long-term Immunity of a Phase-Locked Loop. J. Electron. Test. 28 (6) (2012)
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28 (3) (2012)
Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Trans. Instrum. Meas. 61 (3) (2012)
Alexandre Boyer, Sonia Ben Dhia, B. Li, C. Lemoine, Bertrand Vrignon
Prediction of long-term immunity of a phase-locked loop. LATW (2011)
Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Trans. Electron. (12) (2011)
Tsung-Chih Lin, Ming-Jen Kuo, Alexandre Boyer
Integrated Circuit Emission Model Extraction with a Fuzzy Logic System. Int. J. Fuzzy Syst. Appl. 1 (2) (2011)
B. Li, N. Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectron. Reliab. 51 (9-11) (2011)
N. Berbel, Raúl Fernández-García, Ignacio Gil, B. Li, Alexandre Boyer, Sonia Bendhia
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. Microelectron. Reliab. 51 (9-11) (2011)
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro
IC immunity modeling process validation using on-chip measurements. LATW (2011)
B. Li, Alexandre Boyer, Sonia Bendhia, C. Lemoine
Ageing effect on electromagnetic susceptibility of a phase locked loop. Microelectron. Reliab. 50 (9-11) (2010)
Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectron. J. 39 (12) (2008)
R. Ondo-Ndong, G. Ferblantier, Frédérique Pascal-Delannoy, Alexandre Boyer, A. Foucaran
Electrical properties of zinc oxide sputtered thin films. Microelectron. J. 34 (11) (2003)
F. Mailly, A. Martinez, Alain Giani, Frédérique Pascal-Delannoy, Alexandre Boyer
Design of a micromachined thermal accelerometer: thermal simulation and experimental results. Microelectron. J. 34 (4) (2003)