Letícia Maria Bolzani Poehls

Publication Activity (10 Years)

Years Active: 2011-2022
Publications (10 Years): 9

Top Topics

Sound And Complete Axiomatization

Randomly Selected

Journal Articles

Reliability Analysis

Top Venues

J. Electron. Test.

J. Low Power Electron.

Publications

Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. LATS (2022)
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29 (6) (2021)
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37 (3) (2021)
Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) (2017)
Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls
Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC (2017)
M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls
Analyzing NBTI impact on SRAMs with resistive-open defects. LATS (2016)
Letícia Maria Bolzani Poehls
Selected Peer Reviewed Articles from the 17th "IEEE Latin-American Test Symposium, " Foz do Iguaçu, Brazil, April 6-8, 2016. J. Low Power Electron. 12 (4) (2016)
Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii
Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs. VLSI Design (2015)
Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas
NBTI-aware design of integrated circuits: a hardware-based approach. LATS (2015)
Letícia Maria Bolzani Poehls, Matteo Sonza Reorda
Selected Peer-Reviewed Articles from the 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013. J. Low Power Electron. 10 (1) (2014)
Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes
An On-Chip Sensor to Monitor NBTI Effects in SRAMs. J. Electron. Test. 30 (2) (2014)
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti
Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW (2014)
Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls
Identifying NBTI-Critical Paths in Nanoscale Logic. DSD (2013)
C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. EMC Compo (2013)
Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation. J. Electron. Test. 28 (6) (2012)
Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, N. Marroni, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. J. Electron. Test. 28 (6) (2012)
Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas
On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. DDECS (2012)
Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas
Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study. LATW (2011)
Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Sebastián E. García, Edmundo Gatti, Fernando Hernandez, Ney Laert Vilar Calazans
Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity. LATW (2011)