Lizhou Wu

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 31

Top Topics

Architectural Design

Random Number Generator

Software And Hardware Implementations

Top Venues

Publications

Lizhou Wu, Chenyang Zhao, Jingbo Wang, Xueru Yu, Shoumian Chen, Chen Li, Jun Han, Xiaoyong Xue, Xiaoyang Zeng
A Heuristic and Greedy Weight Remapping Scheme with Hardware Optimization for Irregular Sparse Neural Networks Implemented on CIM Accelerator in Edge AI Applications. ASPDAC (2024)
Yifan Yang, Wentao Hong, Zhuang Ma, Lizhou Wu, Yang Ou, Jie Shen, Nong Xiao
Architectural Design of High-Capacity Cache Based on MRAM Technology. CNIOT (2024)
Siqing Fu, Tiejun Li, Chunyuan Zhang, Sheng Ma, Jianmin Zhang, Lizhou Wu
Spin-NeuroMem: A Low-Power Neuromorphic Associative Memory Design Based on Spintronic Devices. CoRR (2024)
Bo Wang, Sheng Ma, Shengbai Luo, Lizhou Wu, Jianmin Zhang, Chunyuan Zhang, Tiejun Li
SparGD: A Sparse GEMM Accelerator with Dynamic Dataflow. ACM Trans. Design Autom. Electr. Syst. 29 (2) (2024)
Siqing Fu, Tiejun Li, Chunyuan Zhang, Hanqing Li, Sheng Ma, Jianmin Zhang, Ruiyi Zhang, Lizhou Wu
RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device. CoRR (2023)
Shuairun Zhu, Lizhou Wu, Xiaolin Song
An improved matrix split-iteration method for analyzing underground water flow. Eng. Comput. 39 (3) (2023)
Xiang Hou, Yuan Yuan, Sheng Ma, Rui Xu, Bo Wang, Tiejun Li, Wei Jiang, Lizhou Wu, Jianmin Zhang
Optimizing the Parallelism of Communication and Computation in Distributed Training Platform. ICA3PP (1) (2023)
Xiao Yi, Bo Wang, Shengbai Luo, Tiejun Li, Lizhou Wu, Jianmin Zhang, Kenli Li, Sheng Ma
A Hybrid Kernel Pruning Approach for Efficient and Accurate CNNs. ICA3PP (7) (2023)
Siqing Fu, Tiejun Li, Chunyuan Zhang, Hanqing Li, Sheng Ma, Jianmin Zhang, Ruiyi Zhang, Lizhou Wu
RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device. IEEE Trans. Very Large Scale Integr. Syst. 31 (10) (2023)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. IEEE Trans. Computers 71 (9) (2022)
Xuran Ge, Yang Liu, Lizhou Wu, Yang Ou, Zhiguang Chen, Nong Xiao
PM-based Persistent Key Value Stores: a Survey. DSIT (2022)
Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18 (3) (2022)
Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui
Special Session: STT-MRAMs: Technology, Design and Test. VTS (2022)
Xuran Ge, Ming-che Lai, Yang Liu, Lizhou Wu, Zhutao Zhuang, Yang Ou, Zhiguang Chen, Nong Xiao
SpacKV: A Pmem-Aware Key-Value Separation Store Based on LSM-Tree. NPC (2022)
Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, J. Gomez, Michelangelo Grosso, Andrea Guerriero, I. Guglielminetti, Said Hamdioui, G. Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS (2022)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (11) (2022)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. ITC (2021)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. DATE (2021)
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29 (6) (2021)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Impact of Magnetic Coupling and Density on STT-MRAM Performance. CoRR (2020)
Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. ETS (2020)
Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui
Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests. CoRR (2020)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Impact of Magnetic Coupling and Density on STT-MRAM Performance. DATE (2020)
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE (2020)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. ITC (2020)
Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS (2020)
Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC (2019)
Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS (2019)
Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui
Electrical Modeling of STT-MRAM Defects. ITC (2018)
Yang Ou, Nong Xiao, Fang Liu, Zhiguang Chen, Wei Chen, Lizhou Wu
Gemini: A Novel Hardware and Software Implementation of High-performance PCIe SSD. Int. J. Parallel Program. 45 (4) (2017)
Lizhou Wu, Nong Xiao, Fang Liu, Yimo Du, Shuo Li, Yang Ou
Dysource: a high performance and scalable NAND flash controller architecture based on source synchronous interface. Conf. Computing Frontiers (2015)