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A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.
Guilherme Cardoso Medeiros
Cemil Cem Gürsoy
Lizhou Wu
Moritz Fieback
Maksim Jenihhin
Mottaqiallah Taouil
Said Hamdioui
Published in:
DATE (2020)
Keyphrases
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detection method
automatic detection
detection scheme
neural network
feature selection
search algorithm
expert systems
feature vectors
test cases