Cemil Cem Gürsoy

Publication Activity (10 Years)

Years Active: 2015-2022
Publications (10 Years): 14

Top Topics

Design Automation

Test Generation

Fault Injection

Top Venues

J. Electron. Test.

Publications

Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui
On BTI Aging Rejuvenation in Memory Address Decoders. CoRR (2022)
Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui
On BTI Aging Rejuvenation in Memory Address Decoders. LATS (2022)
Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu
Modeling Soft-Error Reliability Under Variability. DFT (2021)
Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar
New categories of Safe Faults in a processor-based Embedded System. CoRR (2020)
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE (2020)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors. CoRR (2019)
Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Gürsoy, Maksim Jenihhin
On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks. VLSI-SoC (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors. ETS (2019)
Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui
Software-Based Mitigation for Memory Address Decoder Aging. LATS (2019)
Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar
New categories of Safe Faults in a processor-based Embedded System. DDECS (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
Mixed-level identification of fault redundancy in microprocessors. CoRR (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
Mixed-level identification of fault redundancy in microprocessors. LATS (2019)
Cemil Cem Gürsoy, Abdullah Yildiz, Sezer Gören
On optimization of multi-cycle tests for test quality and application time. EWDTS (2016)
Sezer Gören, Cemil Cem Gürsoy, Abdullah Yildiz
Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection. J. Electron. Test. 32 (1) (2016)
Sezer Gören, Cemil Cem Gürsoy, Abdullah Yildiz
Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection. J. Electron. Test. 31 (5-6) (2015)