DESIGN AUTOMATION
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Vishwani D. Agrawal
- Hideo Fujiwara
- Prabhat Mishra
- Gordon Fraser
- Jacob A. Abraham
- Melvin A. Breuer
- Kwang-Ting Cheng
- Krishnendu Chakrabarty
- Raimund Ubar
- Robert Wille
- Andrea Arcuri
- Janak H. Patel
- Michael S. Hsiao
- Jaan Raik
- Kewal K. Saluja
- Franco Fummi
- Alberto L. Sangiovanni-Vincentelli
- John P. Hayes
- Tao Xie
- Xiaoqing Wen
- Seiji Kajihara
- Niraj K. Jha
- Elizabeth M. Rudnick
- Rolf Drechsler
- Sandeep K. Gupta
- Indradeep Ghosh
- A. Richard Newton
- Kozo Kinoshita
- Tsung-Yi Ho
- Srimat T. Chakradhar
- Magdy S. Abadir
- Michael L. Bushnell
- Miron Abramovici
- Tomoo Inoue
- Yuzo Takamatsu
- Ajit Kambil
- Nikolai Tillmann
Venues
- DAC
- CoRR
- ITC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DATE
- ICCAD
- ISCAS
- ASP-DAC
- VLSI Design
- IEEE Des. Test Comput.
- Sensors
- VTS
- Asian Test Symposium
- ISQED
- Computer
- Comput. Aided Des.
- Proc. IEEE
- ICECS
- IEEE Trans. Computers
- Microelectron. Reliab.
- IEEE Access
- HICSS
- ICCD
- IEEE Trans. Ind. Electron.
- J. Electron. Test.
- IEEE Des. Test
- AMIA
- IEEE Trans. Very Large Scale Integr. Syst.
- ACM Trans. Design Autom. Electr. Syst.
- ACM Great Lakes Symposium on VLSI
- J. Comput. Chem.
- EURO-DAC
- ASE
- J. Am. Medical Informatics Assoc.
- Microelectron. J.
- FMCAD
- IFIP Congress
- ISVLSI
- EWDTS
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