DESIGN AUTOMATION
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Vishwani D. Agrawal
- Hideo Fujiwara
- Gordon Fraser
- Prabhat Mishra
- Jacob A. Abraham
- Melvin A. Breuer
- Kwang-Ting Cheng
- Krishnendu Chakrabarty
- Raimund Ubar
- Robert Wille
- Andrea Arcuri
- Janak H. Patel
- Jaan Raik
- Michael S. Hsiao
- Kewal K. Saluja
- Alberto L. Sangiovanni-Vincentelli
- Franco Fummi
- Seiji Kajihara
- John P. Hayes
- Tao Xie
- Xiaoqing Wen
- Elizabeth M. Rudnick
- Niraj K. Jha
- Tsung-Yi Ho
- Rolf Drechsler
- A. Richard Newton
- Indradeep Ghosh
- Sandeep K. Gupta
- Kozo Kinoshita
- Michael L. Bushnell
- Srimat T. Chakradhar
- Miron Abramovici
- Magdy S. Abadir
- Giovanni De Micheli
- Nikolai Tillmann
- Yuzo Takamatsu
- Ajit Kambil
Venues
- DAC
- CoRR
- DATE
- ITC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICCAD
- ISCAS
- ASP-DAC
- Sensors
- VLSI Design
- IEEE Des. Test Comput.
- Asian Test Symposium
- VTS
- ISQED
- IEEE Access
- Comput. Aided Des.
- Computer
- Proc. IEEE
- ICECS
- IEEE Trans. Computers
- Microelectron. Reliab.
- ICCD
- HICSS
- IEEE Trans. Ind. Electron.
- IEEE Des. Test
- J. Electron. Test.
- AMIA
- IEEE Trans. Very Large Scale Integr. Syst.
- ACM Great Lakes Symposium on VLSI
- ACM Trans. Design Autom. Electr. Syst.
- J. Comput. Chem.
- ASE
- EURO-DAC
- J. Am. Medical Informatics Assoc.
- Microelectron. J.
- CDC
- FMCAD
- ISVLSI
- IEEE Trans. Instrum. Meas.
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