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On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks.

Aleksa DamljanovicGiovanni SquilleroCemil Cem GürsoyMaksim Jenihhin
Published in: VLSI-SoC (2019)
Keyphrases
  • data analysis
  • general purpose
  • machine learning
  • real time
  • image processing
  • image analysis
  • low cost
  • quantitative analysis
  • wet lab