Adeboye Stephen Oyeniran

Publication Activity (10 Years)

Years Active: 2017-2022
Publications (10 Years): 18

Top Topics

Symbolic Execution

Design Automation

Application Specific

Top Venues

Publications

Adeboye Stephen Oyeniran, Maksim Jenihhin, Jaan Raik, Raimund Ubar
High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test. ISVLSI (2022)
Maksim Jenihhin, Adeboye Stephen Oyeniran, Jaan Raik, Raimund Ubar
Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules. DSD (2021)
Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar
New categories of Safe Faults in a processor-based Embedded System. CoRR (2020)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors. J. Electron. Test. 36 (1) (2020)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors. DSD (2020)
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Adeboye Stephen Oyeniran
Application Specific True Critical Paths Identification in Sequential Circuits. IOLTS (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
On Test Generation for Microprocessors for Extended Class of Functional Faults. VLSI-SoC (Selected Papers) (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors. CoRR (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
Implementation-Independent Functional Test Generation for MSC Microprocessors. VLSI-SoC (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors. ETS (2019)
Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar
New categories of Safe Faults in a processor-based Embedded System. DDECS (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
Mixed-level identification of fault redundancy in microprocessors. CoRR (2019)
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
Mixed-level identification of fault redundancy in microprocessors. LATS (2019)
Adeboye Stephen Oyeniran, Raimund Ubar
High-Level Functional Test Generation for Microprocessor Modules. MIXDES (2019)
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
Combined pseudo-exhaustive and deterministic testing of array multipliers. AQTR (2018)
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation. ISCAS (2018)
Siavoosh Payandeh Azad, Adeboye Stephen Oyeniran, Raimund Ubar
Replication-Based Deterministic Testing of 2-Dimensional Arrays with Highly Interrelated Cells. DDECS (2018)
Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar
High-level test data generation for software-based self-test in microprocessors. MECO (2017)