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On Test Generation for Microprocessors for Extended Class of Functional Faults.
Adeboye Stephen Oyeniran
Raimund Ubar
Maksim Jenihhin
Jaan Raik
Published in:
VLSI-SoC (Selected Papers) (2019)
Keyphrases
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test generation
test cases
mutation testing
test sequences
design automation
symbolic execution
computer vision
fault detection
data sets
fault diagnosis
information systems
training data
static analysis
quality assurance
regression testing