REGRESSION TESTING
Experts
- Gordon Fraser
- Tsong Yueh Chen
- Lionel C. Briand
- Gregg Rothermel
- T. H. Tse
- Andrea Arcuri
- Irith Pomeranz
- Hyunsook Do
- Mary Jean Harrold
- Atif M. Memon
- Antonia Bertolino
- Vahid Garousi
- Robert M. Hierons
- Mark Harman
- Tao Xie
- Yvan Labiche
- Kai-Yuan Cai
- Michael Felderer
- Sudhakar M. Reddy
- Zhenyu Chen
- W. K. Chan
- Jinfu Chen
- Dave Towey
- Rudolf Ramler
- Rubing Huang
- Dan Hao
- Lu Zhang
- Yves Le Traon
- Durga Prasad Mohapatra
- Arnaud Gotlieb
- Dusica Marijan
- Lingming Zhang
- Sebastian G. Elbaum
- Myra B. Cohen
- José Carlos Maldonado
- Alessandro Orso
- Andy Zaidman
- Wasif Afzal
- Baowen Xu
Venues
- CoRR
- ICSM
- ICST
- ICST Workshops
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- Inf. Softw. Technol.
- ACM SIGSOFT Softw. Eng. Notes
- Softw. Test. Verification Reliab.
- ICSE
- ITC
- ISSTA
- SEKE
- COMPSAC
- J. Softw. Maintenance Res. Pract.
- ASE
- ISSRE
- Softw. Qual. J.
- APSEC
- QSIC
- IEEE Access
- Empir. Softw. Eng.
- CSMR
- Int. J. Softw. Eng. Knowl. Eng.
- IEEE Softw.
- ESEC/SIGSOFT FSE
- SAC
- AST
- ACM Trans. Softw. Eng. Methodol.
- VTS
- QRS Companion
- ICSME
- Asian Test Symposium
- ICTSS
- Software Engineering Research and Practice
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- SIGSOFT FSE
- SAST
- FASE
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