High-level test data generation for software-based self-test in microprocessors.
Adeboye Stephen OyeniranArtjom JasnetskiAnton TsertovRaimund UbarPublished in: MECO (2017)
Keyphrases
- test data generation
- test cases
- high level
- software testing
- test case generation
- simulated annealing algorithm
- symbolic execution
- search based testing
- low level
- test generation
- software systems
- fitness function
- source code
- generation algorithm
- personal computer
- simulated annealing
- programming language
- data sets
- test data
- case study
- test suite
- error rate
- quality assurance
- genetic algorithm
- databases