Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules.
Maksim JenihhinAdeboye Stephen OyeniranJaan RaikRaimund UbarPublished in: DSD (2021)
Keyphrases
- test generation
- instruction set
- test cases
- mutation testing
- design automation
- computer architecture
- test sequences
- computation intensive
- high speed
- symbolic execution
- application specific
- floating point
- real world
- general purpose
- software testing
- quality assurance
- fault diagnosis
- embedded systems
- hardware architecture
- image processing