Login / Signup

Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors.

Adeboye Stephen OyeniranRaimund UbarMaksim JenihhinJaan Raik
Published in: DSD (2020)
Keyphrases
  • test cases
  • computer architecture
  • fault diagnosis
  • built in self test
  • neural network
  • test data
  • implementation issues
  • expert systems
  • statistical significance
  • implementation details
  • test generation
  • fault model