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High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors.
Adeboye Stephen Oyeniran
Raimund Ubar
Maksim Jenihhin
Cemil Cem Gürsoy
Jaan Raik
Published in:
CoRR (2019)
Keyphrases
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test generation
high level
test cases
low level
instruction set
test sequences
symbolic execution
static analysis
design automation
quality assurance
parallel computing
mutation testing
query language
low cost
application specific
test data generation