Moritz Fieback

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 42

Top Topics

Special Session

Lifecycle Management

Hopfield Networks

Fault Detection

Top Venues

Publications

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE (2024)
Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS (2024)
Moritz Fieback, Letícia Maria Veiras Bolzani Poehls
Lifecycle Management of Emerging Memories. ETS (2024)
Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS (2024)
Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Online Detection of Unique Faults in RRAMs. ETS (2024)
Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. LATS (2024)
Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. J. Electron. Test. 40 (2) (2024)
Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui
Characterization and Test of Intermittent Over RESET in RRAMs. ATS (2023)
Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ETS (2023)
Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui
Online Fault Detection and Diagnosis in RRAM. ETS (2023)
Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui
Dependability of Future Edge-AI Processors: Pandora's Box. ETS (2023)
Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui
Device Aware Diagnosis for Unique Defects in STT-MRAMs. ATS (2023)
Sicong Yuan, Z. Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, M. Taouil, Said Hamdioui
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC (2023)
Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC (2023)
Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE (2023)
Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
Structured Test Development Approach for Computation-in-Memory Architectures. ITC-Asia (2022)
Troya Çagil Köylü, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil
Using Hopfield Networks to Correct Instruction Faults. ATS (2022)
Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18 (3) (2022)
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui
Hierarchical Memory Diagnosis. ETS (2022)
Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. LATS (2022)
Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. ETS (2022)
Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui
Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. ITC (2022)
Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, J. Gomez, Michelangelo Grosso, Andrea Guerriero, I. Guglielminetti, Said Hamdioui, G. Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS (2022)
G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS (2021)
Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, M. Moreau
Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. DATE (2021)
Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Intermittent Undefined State Fault in RRAMs. ETS (2021)
Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electron. Test. 37 (4) (2021)
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29 (6) (2021)
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani
Evaluating the Impact of Process Variation on RRAMs. LATS (2021)
G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui
Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS (2021)
Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui
Testing Scouting Logic-Based Computation-in-Memory Architectures. ETS (2020)
Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access 8 (2020)
Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. ETS (2020)
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE (2020)
Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS (2020)
Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS (2019)
Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui
Rebooting Computing: The Challenges for Test and Reliability. DFT (2019)
Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil
Testing Computation-in-Memory Architectures Based on Emerging Memories. ITC (2019)
Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC (2019)
Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti
Ionizing radiation modeling in DRAM transistors. LATS (2018)
Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
Testing Resistive Memories: Where are We and What is Missing? ITC (2018)