Device-Aware Diagnosis for Yield Learning in RRAMs.
Hanzhi XunMoritz FiebackSicong YuanHassen AzizaMottaqiallah TaouilSaid HamdiouiPublished in: DATE (2024)
Keyphrases
- learning process
- learning algorithm
- active learning
- control system
- inductive inference
- mobile learning
- learning mechanism
- genetic algorithm
- cognitive load
- learning scheme
- incremental learning
- learning tasks
- learning systems
- knowledge acquisition
- online learning
- supervised learning
- domain knowledge
- information systems
- social networks