Hassen Aziza

Publication Activity (10 Years)

Years Active: 2002-2024
Publications (10 Years): 49

Top Topics

Fourier Transform

Comparative Analysis

Top Venues

Microelectron. Reliab.

J. Low Power Electron.

Publications

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE (2024)
Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS (2024)
Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Online Detection of Unique Faults in RRAMs. ETS (2024)
Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui
Characterization and Test of Intermittent Over RESET in RRAMs. ATS (2023)
Wafa Zitouni, Rémy Vauché, Hassen Aziza, Laila Ayache, Alaa Makdissi
Cortex-M0+-based Pacemaker: CMOS Technologies Benchmark to Achieve Ultra-Low Power Operations. DTTIS (2023)
Hassen Aziza, Cristian Zambelli, Said Hamdioui, Sumit Diware, Rajendra Bishnoi, Anteneh Gebregiorgis
On the Reliability of RRAM-Based Neural Networks. VLSI-SoC (2023)
Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations. J. Electron. Test. 39 (3) (2023)
Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC (2023)
Hassen Aziza, Jérémy Postel-Pellerin, Hussein Bazzi, Mathieu Moreau, Adnan Harb
STATE: A Test Structure for Rapid Prediction of Resistive RAM Electrical Parameter Variability. ISCAS (2022)
Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18 (3) (2022)
Paul Devoge, Hassen Aziza, Philippe Lorenzini, Alexandre Malherbe, Franck Julien, Abderrezak Marzaki, Arnaud Régnier, Stephan Niel
Digital-to-analog converters to benchmark the matching performance of a new zero-cost transistor. ISCAS (2022)
Paul Devoge, Hassen Aziza, Philippe Lorenzini, Pascal Masson, Alexandre Malherbe, Franck Julien, Abderrezak Marzaki, Arnaud Régnier, Stephan Niel
A Schmitt trigger to benchmark the performance of a new zero-cost transistor. ICECS 2022 (2022)
Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability. J. Electron. Test. 37 (4) (2021)
Paul Devoge, Hassen Aziza, Philippe Lorenzini, Franck Julien, Abderrezak Marzaki, Alexandre Malherbe, Marc Mantelli, Thomas Sardin, Sébastien Haendler, Arnaud Régnier, Stephan Niel
Circuit-level evaluation of a new zero-cost transistor in an embedded non-volatile memory CMOS technology. DTIS (2021)
Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, M. Moreau
Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. DATE (2021)
Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Intermittent Undefined State Fault in RRAMs. ETS (2021)
Pablo Ilha Vaz, Patrick Girard, Arnaud Virazel, Hassen Aziza
Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors. IEEE Trans. Very Large Scale Integr. Syst. 29 (6) (2021)
Hassen Aziza, Karine Coulié, Wenceslas Rahajandraibe
Design Considerations Towards Zero-Variability Resistive RAMs in HRS State. LATS (2021)
Zoran Stamenkovic, Hassen Aziza, Ernesto Sánchez, Alberto Bosio
Tutorial: Silicon Systems for Wireless LAN. DDECS (2021)
Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe
Investigation of Single Event Effects in a Resistive RAM memory array by SPICE level simulation. LATS (2021)
Romeric Gay, Vincenzo Della Marca, Hassen Aziza, Arnaud Régnier, Stephan Niel, Abderrezak Marzaki
Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology. DTIS (2021)
Basma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza
A Lightweight Reconfigurable RRAM-based PUF for Highly Secure Applications. DFT (2020)
Hussein Bazzi, Jérémy Postel-Pellerin, Hassen Aziza, Mathieu Moreau, Adnan Harb
Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number Generation. DFT (2020)
Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb
Design of a Novel Hybrid CMOS Non-Volatile SRAM Memory in 130nm RRAM Technology. DTIS (2020)
Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access 8 (2020)
Pablo Ilha Vaz, Patrick Girard, Arnaud Virazel, Hassen Aziza
A CMOS OxRAM-Based Neuron Circuit Hardened with Enclosed Layout Transistors for Aerospace Applications. IOLTS (2020)
Hassen Aziza, Christian Dufaza, Annie Pérez, Said Hamdioui
Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs. J. Circuits Syst. Comput. 28 (13) (2019)
Basma Hajri, Hassen Aziza, Mohammad M. Mansour, Ali Chehab
RRAM Device Models: A Comparative Analysis With Experimental Validation. IEEE Access 7 (2019)
Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC (2019)
Hassen Aziza, Hussein Bazzi, Jérémy Postel-Pellerin, Pierre Canet, Mathieu Moreau, Adnan Harb
An Augmented OxRAM Synapse for Spiking Neural Network (SNN) Circuits. DTIS (2019)
Hassen Aziza, Mathieu Moreau, Annie Pérez, Arnaud Virazel, Patrick Girard
A Capacitor-Less CMOS Neuron Circuit for Neuromemristive Networks. NEWCAS (2019)
Jérémy Postel-Pellerin, Hussein Bazzi, Hassen Aziza, Pierre Canet, Mathieu Moreau, Vincenzo Della Marca, Adnan Harb
True random number generation exploiting SET voltage variability in resistive RAM memory arrays. NVMTS (2019)
Hassen Aziza, Basma Hajri, Mohammad M. Mansour, Ali Chehab, Annie Pérez
A lightweight write-assist scheme for reduced RRAM variability and power. Microelectron. Reliab. (2018)
Hassen Aziza, Christian Dufaza, Annie Pérez
A configurable operational amplifier based on oxide resistive RAMs. DTIS (2018)
Hussein Bazzi, Adnan Harb, Hassen Aziza, Mathieu Moreau
Novel RRAM CMOS Non-Volatile Memory Cells in 130nm Technology. ICCA (2018)
Hussein Bazzi, Adnan Harb, Hassen Aziza, Mathieu Moreau
Design of Hybrid CMOS Non-Volatile SRAM Cells in 130nm RRAM Technology. ICM (2018)
Steve Ngueya W., Jean-Michel Portal, Hassen Aziza, Julien Mellier, Stephane Ricard
An Ultra-Low Power and High Performance Single Ended Sense Amplifier for Low Voltage Flash Memories. J. Low Power Electron. 14 (1) (2018)
Mathieu Moreau, Eloi Muhr, Marc Bocquet, Hassen Aziza, Jean-Michel Portal, Bastien Giraud, Jean-Philippe Noel
Reliable ReRAM-based Logic Operations for Computing in Memory. VLSI-SoC (2018)
Hassen Aziza, Karine Coulié, Wenceslas Rahajandraibe, Remy Vauche
Using short-term fourier transform for particle detection and recognition in a CMOS oscillator-based chain. LATS (2018)
Basma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza
Memristor models optimization for large-scale 1T1R memory arrays. ICICDT (2018)
Basma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza
Oxide-based RRAM models for circuit designers: A comparative analysis. DTIS (2017)
Steve Ngueya W., Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza
Power efficiency optimization of charge pumps in embedded low voltage NOR flash memory. NORCAS (2017)
Steve Ngueya W., Jean-Michel Portal, Hassen Aziza, Julien Mellier, Stephane Ricard
A Power Efficient Regulated Charge Pump Based on Charge Sharing for Contactless Devices: An Alternative to Four-Phase Charge Pumps. J. Low Power Electron. 13 (4) (2017)
Steve Ngueya W., Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza
High voltage recycling scheme to improve power consumption of regulated charge pumps. PATMOS (2017)
Steve Ngueya W., Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza
An Ultra-Low Power and High Speed Single Ended Sense Amplifier for Non-Volatile Memories. NGCAS (2017)
Pierre Canet, Jérémy Postel-Pellerin, Hassen Aziza
Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories. Microelectron. Reliab. 64 (2016)
Hassen Aziza, Haithem Ayari, Santhosh Onkaraiah, Mathieu Moreau, Jean-Michel Portal, Marc Bocquet
Multilevel operation in oxide based resistive RAM with SET voltage modulation. DTIS (2016)
Karine Coulié-Castellani, Wenceslas Rahajandraibe, Gilles Micolau, Hassen Aziza, Jean-Michel Portal
Optimization of a Particles Detection Chain Based on a VCO Structure. J. Electron. Test. 32 (1) (2016)
Hassen Aziza, Jean-Michel Portal
Resistive RAM variability monitoring using a ring oscillator based test chip. Microelectron. Reliab. 64 (2016)
Loic Welter, J. L. Scotto di Quaquero, Philippe Dreux, Laurent Lopez, Hassen Aziza, Jean-Michel Portal
Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectron. Reliab. 55 (9-10) (2015)
Wenceslas Rahajandraibe, Fayrouz Haddad, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal
Low cost built-in-tuning of on-chip passive filters for low-if double quadrature rf receiver. LATS (2015)
Karine Coulié-Castellani, Wenceslas Rahajandraibe, Hassen Aziza, Jean-Michel Portal, Gilles Micolau
Improvement of a detection chain based on a VCO concept for microelectronic reliability under natural radiative environment. LATS (2015)
Elena I. Vatajelu, Hassen Aziza, Cristian Zambelli
Nonvolatile memories: Present and future challenges. IDT (2014)
Karine Coulié-Castellani, Wenceslas Rahajandraibe, Gilles Micolau, Hassen Aziza, Jean-Michel Portal
Improvement of a VCO concept for low energy particule detection and recognition. LATW (2014)
Weisheng Zhao, Mathieu Moreau, Erya Deng, Yue Zhang, Jean-Michel Portal, Jacques-Olivier Klein, Marc Bocquet, Hassen Aziza, Damien Deleruyelle, Christophe Muller, Damien Querlioz, Nesrine Ben Romdhane, Dafine Ravelosona, Claude Chappert
Synchronous Non-Volatile Logic Gate Design Based on Resistive Switching Memories. IEEE Trans. Circuits Syst. I Regul. Pap. (2) (2014)
Wenceslas Rahajandraibe, Fayrouz Haddad, Hassen Aziza, Karine Coulié-Castellani, Jean-Michel Portal
Low Power Radio Frequency Transceiver with Built-In-Tuning of the Local Oscillator for Open Loop Modulation. J. Low Power Electron. 10 (1) (2014)
Loic Welter, Philippe Dreux, Hassen Aziza, Jean-Michel Portal
An innovative standard cells remapping method for in-circuit critical parameters monitoring. IOLTS (2014)
Loic Welter, Philippe Dreux, Jordan Innocenti, Hassen Aziza, Jean-Michel Portal
Accurate multiplexed test structure for threshold voltage matching evaluation. DTIS (2014)
Hassen Aziza, Haithem Ayari, Santhosh Onkaraiah, Jean-Michel Portal, Mathieu Moreau, Marc Bocquet
Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability. DFT (2014)
Weisheng Zhao, Jean-Michel Portal, Wang Kang, Mathieu Moreau, Yue Zhang, Hassen Aziza, Jacques-Olivier Klein, Zhaohao Wang, Damien Querlioz, Damien Deleruyelle, Marc Bocquet, Dafine Ravelosona, Christophe Muller, Claude Chappert
Design and analysis of crossbar architecture based on complementary resistive switching non-volatile memory cells. J. Parallel Distributed Comput. 74 (6) (2014)
Hassen Aziza, Marc Bocquet, Jean-Michel Portal, Mathieu Moreau, Christophe Muller
A novel test structure for OxRRAM process variability evaluation. Microelectron. Reliab. 53 (9-11) (2013)
Wenceslas Rahajandraibe, Fayrouz Haddad, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal
Built-in tuning of the local oscillator for open loop modulation of low cost, low power RF transceiver. LATW (2013)
Loic Welter, Philippe Dreux, Jean-Michel Portal, Hassen Aziza
Embedded high-precision frequency-based capacitor measurement system. IOLTS (2013)
Yue Zhang, Erya Deng, Jacques-Olivier Klein, Damien Querlioz, Dafine Ravelosona, Claude Chappert, Weisheng Zhao, Mathieu Moreau, Jean-Michel Portal, Marc Bocquet, Hassen Aziza, Damien Deleruyelle, Christophe Muller
Synchronous full-adder based on complementary resistive switching memory cells. NEWCAS (2013)
Fayrouz Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal, Jamel Nebhen, Hervé Barthélemy
Low-cost auto-calibration of passive polyphase filter in image reject receiver. ICECS (2013)
Fayrouz Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal
On the investigation of built-in tuning of RF receivers using on-chip polyphase filters. VTS (2013)
Hassen Aziza, Marc Bocquet, Mathieu Moreau, Jean-Michel Portal
Single-ended sense amplifier robustness evaluation for OxRRAM technology. IDT (2013)
Jean-Michel Portal, Mathieu Moreau, Marc Bocquet, Hassen Aziza, Damien Deleruyelle, Christophe Muller, Yue Zhang, Erya Deng, Jacques-Olivier Klein, Damien Querlioz, Dafine Ravelosona, Claude Chappert, Weisheng Zhao
Analytical study of complementary memristive synchronous logic gates. NANOARCH (2013)
Karine Castellani-Coulié, Marc Bocquet, Hassen Aziza, Jean-Michel Portal, Wenceslas Rahajandraibe, Christophe Muller
SPICE level analysis of Single Event Effects in an OxRRAM cell. LATW (2013)
Karine Castellani-Coulié, Hassen Aziza, Wenceslas Rahajandraibe, Gilles Micolau, Jean-Michel Portal
Investigation of a CMOS oscillator concept for particle detection and diagnosis. LATW (2012)
Fayrouz Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal
Built-in tuning of RFIC Passive Polyphase Filter by process and thermal monitoring. LATW (2012)
Karine Castellani-Coulié, Hassen Aziza, Gilles Micolau, Jean-Michel Portal
Optimization of SEU Simulations for SRAM Cells Reliability under Radiation. J. Electron. Test. 28 (3) (2012)
Weisheng Zhao, Yue Zhang, Jacques-Olivier Klein, Damien Querlioz, Djaafar Chabi, Dafine Ravelosona, Claude Chappert, Jean-Michel Portal, Marc Bocquet, Hassen Aziza, Damien Deleruyelle, Christophe Muller
Crossbar architecture based on 2R complementary resistive switching memory cell. NANOARCH (2012)
Gilles Micolau, Karine Castellani-Coulié, Hassen Aziza, Jean-Michel Portal
SITARe: A simulation tool for analysis and diagnosis of radiation effects. LATW (2012)
Y. Joly, L. Truphemus, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Franck Julien, Pascal Fornara
Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. ISCAS (2011)
Karine Castellani-Coulié, Jean-Michel Portal, Gilles Micolau, Hassen Aziza
Analysis of SEU parameters for the study of SRAM cells reliability under radiation. LATW (2011)
Gilles Micolau, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal
Impact of SEU configurations on a SRAM cell response at circuit level. LATW (2011)
Hassen Aziza, Marc Bocquet, Jean-Michel Portal, Christophe Muller
Bipolar OxRRAM memory array reliability evaluation based on fault injection. IDT (2011)
Y. Joly, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, Franck Julien, Pascal Fornara
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectron. Reliab. 51 (9-11) (2011)
Fabrice Rigaud, Jean-Michel Portal, Hassen Aziza, Didier Née, Julien Vast, Fabrice Argoud, Bertrand Borot
Back-end soft and hard defect monitoring using a single test chip. Microelectron. Reliab. 51 (6) (2011)
Remi Pulicani, Olivier Goducheau, Hubert Degoirat, Hassen Aziza, Annie Pérez, Emmanuel Bergeret
Simulation of intrinsic bipolar transistor mechanisms for future capacitor-less eDRAM on bulk substrate. ICECS (2010)
Olivier Ginez, Jean-Michel Portal, Hassen Aziza
An on-line testing scheme for repairing purposes in Flash memories. DDECS (2009)
Hassen Aziza, Emmanuel Bergeret, Annie Pérez
A novel design methodology for current reference circuits. ICECS (2008)
Olivier Ginez, Jean-Michel Portal, Hassen Aziza
A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. ITC (2008)
Hassen Aziza, Emmanuel Bergeret, Jean-Michel Portal, Olivier Ginez
A Novel Low Power Oriented Design Methodology for Analog Blocks. J. Low Power Electron. 4 (1) (2008)
Hassen Aziza, Emmanuel Bergeret, Annie Pérez
An Automated Design Methodology for Charge Pump Circuits. ICECS (2007)
Jean-Michel Portal, Hassen Aziza, Didier Née
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement. J. Electron. Test. 21 (1) (2005)
Jean-Michel Portal, Hassen Aziza, Didier Née
EEPROM Memory: Threshold Voltage Built In Self Diagnosis. ITC (2003)
Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née
An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. ITC (2002)
Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née
An Automated Design Methodology for EEPROM Cell (ADE). MTDT (2002)