Didier Née

Publication Activity (10 Years)

Years Active: 2002-2011
Publications (10 Years): 0

Publications

Fabrice Rigaud, Jean-Michel Portal, Hassen Aziza, Didier Née, Julien Vast, Fabrice Argoud, Bertrand Borot
Back-end soft and hard defect monitoring using a single test chip. Microelectron. Reliab. 51 (6) (2011)
Laurent Lopez, Jean-Michel Portal, Didier Née
A New Embedded Measurement Structure for eDRAM Capacitor CoRR (2007)
B. Saillet, Jean-Michel Portal, Didier Née
Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring. DFT (2005)
Laurent Lopez, Jean-Michel Portal, Didier Née
A New Embedded Measurement Structure for eDRAM Capacitor. DATE (2005)
Jean-Michel Portal, Hassen Aziza, Didier Née
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement. J. Electron. Test. 21 (1) (2005)
Jean-Michel Portal, Hassen Aziza, Didier Née
EEPROM Memory: Threshold Voltage Built In Self Diagnosis. ITC (2003)
L. Forli, Jean-Michel Portal, Didier Née, Bertrand Borot
Infrastructure IP for Back-End Yield Improvement. ITC (2003)
Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née
An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. ITC (2002)
Jean-Michel Portal, L. Forli, Didier Née
Floating-gate EEPROM cell model based on MOS model 9. ISCAS (3) (2002)
Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née
An Automated Design Methodology for EEPROM Cell (ADE). MTDT (2002)
Jean-Michel Portal, L. Forli, Didier Née
Floating-gate EEPROM cell: threshold voltage sensibility to geometry. ISCAS (1) (2002)