Laurent Lopez

Publication Activity (10 Years)

Years Active: 2005-2015
Publications (10 Years): 3

Top Topics

Power Reduction

Metal Oxide Semiconductor

Structural Properties

Top Venues

Microelectron. Reliab.

Publications

Jordan Innocenti, Franck Julien, Jean-Michel Portal, Laurent Lopez, Q. Hubert, Pascal Masson, Jacques Sonzogni, Stephan Niel, Arnaud Régnier
Layout optimizations to decrease internal power and area in digital CMOS standard cells. MIPRO (2015)
Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan
Dynamic current reduction of CMOS digital circuits through design and process optimization. PATMOS (2015)
Loic Welter, J. L. Scotto di Quaquero, Philippe Dreux, Laurent Lopez, Hassen Aziza, Jean-Michel Portal
Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectron. Reliab. 55 (9-10) (2015)
Jordan Innocenti, Loic Welter, Franck Julien, Laurent Lopez, Jacques Sonzogni, Stephan Niel, Arnaud Régnier, Emmanuel Paire, Karen Labory, Eric Denis, Jean-Michel Portal, Pascal Masson
Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology. MWSCAS (2014)
Benjamin Rebuffat, Vincenzo Della Marca, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Olivier Paulet, Laurent Lopez, Romain Laffont
Effect of ions presence in the SiOCH inter metal dielectric structure. ESSDERC (2013)
Y. Joly, L. Truphemus, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Franck Julien, Pascal Fornara
Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. ISCAS (2011)
Y. Joly, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, Franck Julien, Pascal Fornara
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectron. Reliab. 51 (9-11) (2011)
Claire Le Roux, Laurent Lopez, Abdellatif Firiti, Jean-Luc Ogier, Frédéric Lalande, Romain Laffont, Gilles Micolau
A new method to quantify retention-failed cells of an EEPROM CAST. Microelectron. Reliab. 47 (9-11) (2007)
Laurent Lopez, Jean-Michel Portal, Didier Née
A New Embedded Measurement Structure for eDRAM Capacitor CoRR (2007)
Laurent Lopez, Jean-Michel Portal, Didier Née
A New Embedded Measurement Structure for eDRAM Capacitor. DATE (2005)