Y. Bert

Publication Activity (10 Years)

Years Active: 2011-2011
Publications (10 Years): 0

Publications

Y. Joly, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, Franck Julien, Pascal Fornara
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectron. Reliab. 51 (9-11) (2011)